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FAB ETCH CVD PVD PHOTO METROLOGY ETC
ATE PROBER HANDLER TESTER ETC
PKG DICING SAW WIRE BONDER DIE BONDER BACK GRINDER ETC
OTHERS
K&S MAXUM PLUS WIRE BONDER
ADVANTEST M6542AD HANDLER
RIGAKU MFM65 In-Line X-Ray
ALLIED
OKOS VUE400 SAT System
STRUERS LABOPOL POLISHER
OLYMPUS SZ61TR Microscope
LEICA WILD M8 Microscope
SAMCO RIE-300NR Reactive Ion Etching
LEICA POLYCON Microscope
LEICA POLY VAR SC Microscope
EDWARD PUMP IGX100L
Olympus BH3-MJLA6 Microscope
OLYMPUS BH2 MJL73D MICROSCOPE
CARL ZEISS Axiotron-2 Microscope
HITACHI S5500 CD SEM
CANON_ANELVA I4230 SPUTTER
TSK AWD 300T DICING SAW
K&S MAXUM PLUS WIRE BONDER
Carl Zeiss SMS Gmbh FAB 193
Vision Engineering 5E Measure Scope
NIKON V-24B PROFILE PROJECTOR
N&K ANALYZER 1700RT Wafer Analyzer
OLYMPUS MX50A-F Microscope
KLA ES35 E-BEAM INSPECTION
TSK UF3000 WAFER PROBER
TSK UF200FL WAFER PROBER
CANON ES6 Krf SCANNER
ESI M9850 TPGR LASER REPAIR
HITACHI CM700H Die Bonder
PANASONIC FCB3 Flip Chip Bonder
SDI FAAST-350 SPV
Cascade Microtech REL-6100 Probe Station
STI TR-48II Tape & Reel
SHINKAWA ACB3000(Led) W/B
CANON_ANELVA C-7300 SPUTTER
AMAT UV5 Bright Field Inspection
AMAT COMPLUS4T DARK FIELD
TEL P12XLM WAFER PROBER
ESI M9830 LASER REPAIR
HITACHI I6300 E- BEAM
NEXTEST Maverick-II PT Bitemap Tester
HITACHI DB-700 Die Bonder
MITUTOYO PJ-H30005F
PHILPS X-PERT X-RAY
MORY DSV-3000 Plasma Cleaner
ETCH BT-1 Plasma Cleaner
MARCH PX-1000E8
SHINKAWA UTC1000SUPER W/B
Asymtek X1020 Dispenser
DISCO DFL7160 DAF SAW
OLYMPUS AL-110-LMB12-LP2
지메스테크놀로지 3 DEMESION MEA 3차원 측정기
ADE NANOMAPPER SQM
SEMICS OPUS II WAFER PROBER
HITACHI S9360 CD SEM
TOWA AUTO MOLD Y-1
HITACHI CM700H D/B
PHOENIX NANOMX160 X-RAY
TSK PG300RM BACK GRINDER
MATTSON ASPEN III
Contact

TEL +82-2-582-6900
FAX +82 2-582-6903
Info@asesemiconductor.com

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Suite 410, Korean Business Center B/D