Request
Inventory list
View all
FAB ETCH CVD PVD PHOTO METROLOGY ETC
ATE PROBER HANDLER TESTER ETC
PKG DICING SAW WIRE BONDER DIE BONDER BACK GRINDER ETC
OTHERS
HITACHI IS3000 DARK FIELD
K&S MAXUM PLUS WIRE BONDER
ADVANTEST M6542AD HANDLER
RIGAKU MFM65 In-Line X-Ray
ALLIED
OKOS VUE400 SAT System
STRUERS LABOPOL POLISHER
OLYMPUS SZ61TR Microscope
LEICA WILD M8 Microscope
SAMCO RIE-300NR Reactive Ion Etching
LEICA POLYCON Microscope
LEICA POLY VAR SC Microscope
EDWARD PUMP IGX100L
Olympus BH3-MJLA6 Microscope
OLYMPUS BH2 MJL73D MICROSCOPE
CARL ZEISS Axiotron-2 Microscope
HITACHI S5500 CD SEM
CANON_ANELVA I4230 SPUTTER
TSK AWD 300T DICING SAW
K&S MAXUM PLUS WIRE BONDER
Carl Zeiss SMS Gmbh FAB 193
Vision Engineering 5E Measure Scope
NIKON V-24B PROFILE PROJECTOR
N&K ANALYZER 1700RT Wafer Analyzer
OLYMPUS MX50A-F Microscope
KLA ES35 E-BEAM INSPECTION
TSK UF3000 WAFER PROBER
TSK UF200FL WAFER PROBER
CANON ES6 Krf SCANNER
ESI M9850 TPGR LASER REPAIR
HITACHI CM700H Die Bonder
PANASONIC FCB3 Flip Chip Bonder
SDI FAAST-350 SPV
Cascade Microtech REL-6100 Probe Station
STI TR-48II Tape & Reel
SHINKAWA ACB3000(Led) W/B
CANON_ANELVA C-7300 SPUTTER
AMAT UV5 Bright Field Inspection
AMAT COMPLUS4T DARK FIELD
TEL P12XLM WAFER PROBER
ESI M9830 LASER REPAIR
HITACHI I6300 E- BEAM
NEXTEST Maverick-II PT Bitemap Tester
HITACHI DB-700 Die Bonder
MITUTOYO PJ-H30005F
PHILPS X-PERT X-RAY
MORY DSV-3000 Plasma Cleaner
ETCH BT-1 Plasma Cleaner
MARCH PX-1000E8
SHINKAWA UTC1000SUPER W/B
Asymtek X1020 Dispenser
DISCO DFL7160 DAF SAW
OLYMPUS AL-110-LMB12-LP2
지메스테크놀로지 3 DEMESION MEA 3차원 측정기
ADE NANOMAPPER SQM
SEMICS OPUS II WAFER PROBER
HITACHI S9360 CD SEM
TOWA AUTO MOLD Y-1
HITACHI CM700H D/B
PHOENIX NANOMX160 X-RAY
TSK PG300RM BACK GRINDER
MATTSON ASPEN III
Contact

TEL +82-2-582-6900
FAX +82 2-582-6903
Info@asesemiconductor.com

Business Hours

Weekday: 09:00 - 18:00
Weekend: Closed

Directions

309, Gangnam-daero, Seocho-gu, Seoul, South Korea
Suite 410, Korean Business Center B/D