Request
Inventory list
View all
FAB ETCH CVD PVD PHOTO METROLOGY ETC
ATE PROBER HANDLER TESTER ETC
PKG DICING SAW WIRE BONDER DIE BONDER BACK GRINDER ETC
OTHERS
TAKATORI ATM12000DR DB MOUNT
(주)제4기한국 JSPCS600G PLASMA CLEANER
VISION SEMICON VSP88H
OLYMPUS STM6-LM SCOPE
CETEK HAWK-1000M WB Multi Bond Test System
FSM AQUAFLEX 4-POINT BENDING
DISCO EAD6750 + SEMES HANDLER
CAMTEK CAMTEK AIM
GATAN 691 ION MILLER
JEOL JSM-7500F SEM
LEICA EM_TIC3X ION MILLER
LEICA M205C MICROSCOPE
CAMECA IMS WF MASS SPECTROMETER
HITACHI S4800 FE SEM
TEL P12XL PROBER
HITACHI SPA300SUPER DIE BONDER
TEMPTRONICS TPO4300A Temp Forcing System
DYNATECH DT_ECS2030 LAMINATOR
OSUNG OS-OVN11-CL01W BAKE OVEN
AMAT(SEMITOOL) RAIDER_ECD WET STATION
MATTSON SUPREMA PR STRIPPER
Laurier DS9000 DIE SORTER
KLA SFX100 Thickness Measurement
TEL P12XL PROBER
MARCH PX1000 Plasma Cleaner
Tektronix TDS 380 Osiloscope
Tektronix TDS 5054 Osiloscope
Tektronix TLA 714 Osiloscope
Tektronix TDS 684A Osiloscope
Tektronix TDS 754D Osiloscope
Shinkawa SFB200 Flip Chip Bonder
ASM IBE139
KLA ARCHER XT+ Overlay
Electroglas EG6000 Prober
Electroglas 4090U Prober
Electroglas 4090U Prober
KLA ARCHER10XT Overlay
TEL INDY Vertical Furnace
AMAT SEMVISION G3 LITE Defect Review System
AMAT DPS G5 ETCHER
LAM VECTOR EXPRESS CVD
ESI M9830 LASER REPAIR
AMAT CARINA MESA ETCHER
HITACHI DB700AC DIE BONDER
DISCO DFG8540 Back Grinder
OLYMPUS MICROSCOPE SZ30
NIOKN MICROSCOPE SMZ645
OLYMPUS MICROSCOPE SZ40
OLYMPUS MICROSCOPE SZ60
HITACHI HD2300 STEM
OLYMPUS MICROSCOPE SZ61
LAM 2300 METAL 45 CHAMBER
TSK PG300RM Back Grinder
PHI680 AES
HITACHI CM700 DIE BONDER
AMAT DPS2_POLY ETCHER
HITACHI IS3000 DARK FIELD
K&S MAXUM PLUS WIRE BONDER
ADVANTEST M6542AD HANDLER
RIGAKU MFM65 In-Line X-Ray
ALLIED
OKOS VUE400 SAT System
STRUERS LABOPOL POLISHER
OLYMPUS SZ61TR Microscope
LEICA WILD M8 Microscope
SAMCO RIE-300NR Reactive Ion Etching
LEICA POLYCON Microscope
LEICA POLY VAR SC Microscope
EDWARD PUMP IGX100L
Olympus BH3-MJLA6 Microscope
OLYMPUS BH2 MJL73D MICROSCOPE
CARL ZEISS Axiotron-2 Microscope
HITACHI S5500 CD SEM
CANON_ANELVA I4230 SPUTTER
TSK AWD 300T DICING SAW
K&S MAXUM PLUS WIRE BONDER
Carl Zeiss SMS Gmbh FAB 193
Vision Engineering 5E Measure Scope
NIKON V-24B PROFILE PROJECTOR
N&K ANALYZER 1700RT Wafer Analyzer
OLYMPUS MX50A-F Microscope
KLA ES35 E-BEAM INSPECTION
TSK UF3000 WAFER PROBER
TSK UF200FL WAFER PROBER
CANON ES6 Krf SCANNER
ESI M9850 TPGR LASER REPAIR
HITACHI CM700H Die Bonder
PANASONIC FCB3 Flip Chip Bonder
SDI FAAST-350 SPV
Cascade Microtech REL-6100 Probe Station
STI TR-48II Tape & Reel
SHINKAWA ACB3000(Led) W/B
CANON_ANELVA C-7300 SPUTTER
AMAT UV5 Bright Field Inspection
AMAT COMPLUS4T DARK FIELD
TEL P12XLM WAFER PROBER
ESI M9830 LASER REPAIR
HITACHI I6300 E- BEAM
NEXTEST Maverick-II PT Bitemap Tester
HITACHI DB-700 Die Bonder
MITUTOYO PJ-H30005F
PHILPS X-PERT X-RAY
MORY DSV-3000 Plasma Cleaner
ETCH BT-1 Plasma Cleaner
MARCH PX-1000E8
SHINKAWA UTC1000SUPER W/B
Asymtek X1020 Dispenser
DISCO DFL7160 DAF SAW
OLYMPUS AL-110-LMB12-LP2
지메스테크놀로지 3 DEMESION MEA 3차원 측정기
ADE NANOMAPPER SQM
SEMICS OPUS II WAFER PROBER
HITACHI S9360 CD SEM
TOWA AUTO MOLD Y-1
HITACHI CM700H D/B
PHOENIX NANOMX160 X-RAY
TSK PG300RM BACK GRINDER
MATTSON ASPEN III
Contact

TEL +82-2-582-6900
FAX +82 2-582-6903
Info@asesemiconductor.com

Business Hours

Weekday: 09:00 - 18:00
Weekend: Closed

Directions

309, Gangnam-daero, Seocho-gu, Seoul, South Korea
Suite 410, Korean Business Center B/D